Influence of pore structure on SIP properties – microscale modelling and measurements

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Citation
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Title:Main Title: Influence of pore structure on SIP properties – microscale modelling and measurements
Description:Abstract: Influence of pore structure on SIP properties – microscale modelling and measurements
Responsible Party
Creator:Jan Volkmann (Owner)
Publisher:CRC/TR32 Database (TR32DB)
Publication Year:2012
Topic
TR32 Topic:Other
Related Subproject:A2
Subject:Keyword: SIP
File Details
Filename:Bonn2009_AKIP-workshop.pdf
Data Type:Text - Text
File Size:631 KB
Dates:Created: 31.10.2012
Issued: 31.10.2012
Mime Type:application/pdf
Data Format:PDF
Language:English
Status:Completed
Constraints
Download Permission:Free
Licence:[TR32DB] Data policy agreement
Geographic
Specific Information - Presentation
Presentation Date:30th of September, 2009
Presentation Type:Talk
Event:International Workshop on Induced Polarization in Near-Surface Geophysics
Event Type:Workshop
Event Location:Bonn, Germany
Event Duration:30th of September, 2009 - 1st of October, 2009
Metadata Details
Metadata Creator:Oliver Mohnke
Metadata Created:31.10.2012
Metadata Last Updated:31.10.2012
Subproject:A2
Funding Phase:1
Metadata Language:English
Metadata Version:V50
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Dataset Downloads:2
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